Instruments
Equipment are reserved through an online reservation system (access limited to authorized users). All instruments are available for external users. Contact Janne Ruokolainen for details.
Transmission electron microscopes
- A double Cs corrected sub-Ångström 200 kV TEM (JEOL)
- A dedicated liquid helium 300 kV cryo-TEM (JEOL)
- A standard 120 kV TEM (FEI)
Scanning electron microscopes
- An analytical field emission SEM (JEOL)
- A variable pressure field emission SEM (Zeiss)
- An environmental LaB6 SEM (Zeiss)
Atomic force microscopes
- Two AFMs with various imaging modes, including a liquid cell (Veeco)
Scanning tunneling microscopes
- Variable temperature STM/AFM
X-ray scattering
- Small-angle X-ray scattering
- Wide-angle X-ray scattering
Tomography
- Workstation for 3D tomography of TEM samples
- 3D printer for making rapid models from tomography (Z Corporation)
Sample preparation
- Cutting thin sections for TEM samples, also for cryo-cutting (Leica)
- Automated vitrifying equipment for cryo-TEM sample preparation (FEI)
- Plasma cleaner (Gatan)
- Glow discharge (Emitech)
- Ion milling/polishing for TEM specimens (Gatan)
- Cross section polisher for SEM specimens (Gatan)
- Mechanical polishing, diamond saw, dimple grinder
- Carbon coating & sputtering equipment (Emitech)