• Transmission Electron Microscopes
• Scanning Electron Microscopes
• Atomic Force Microscopes
  • Veeco Dimension 5000
• Scanning Tunneling Microscopes
• X-Ray Scattering
• Tomography
• Sample Preparation

Atomic Force Microscopes

Contact: M.Sc. Antti Soininen.

Veeco Dimension 5000

Scanning Probe Microscope with NanoScope V controller The Dimension 5000 scanning probe microscope provides semiconductor, data storage device, and optics manufacturers the ultimate automated tool for large-sample metrology and imaging. The system has an XYZ open-loop scanning head.