Nanomicroscopy Center
JEOL JSM-7500FA

JEOL JSM-7500FA

The JSM-7500FA is an analytical Field Emission (cold FEG) SEM featuring enhanced performance, ease of operation, and energy efficiency. It offers a high resolution also at low kV.

JEOL JSM-7500FA Information Card
Manufacturer JEOL
Model JSM-7500FA
Emitter Cold FEG
Installation 2008
Detectors In-column SE
ETSE
BSE (2 segment)
EDX (JEOL)
Resolution 0.6 nm @ 30 kV 
1.4 nm @ 1 kV
Acceleration voltage 0.1 - 30 kV
Probe current -
Operating modes High vacuum (10-5 Pa)
Stage Motorized 5 axis
X & Y 50 mm
Z 25 mm
R 360°
T -5 - 70°
Specimen size max. 100 mm diameter (movement limit 50 mm)
max. 10 mm height
Contact Prof. Janne Ruokolainen (requests for collaboration and usage)
Technical staff M.Sc. Juuso Korhonen (technical issues)
M.Sc. Panu Hiekkataipale (user training)
Dr. Jani Seitsonen (user training)
Pricing Upon request from Prof. Janne Ruokolainen
Availability The instrument is available for outside users, such as other departments, universities, VTT, and industry.
It is also possible to buy imaging service.
Contact Prof. Janne Ruokolainen for details.

Photos and micrographs

JEOL JSM-7500FA

JEOL JSM-7500FA installed in NMC.

 JEOL JSM-7500FA stage

Photograph taken inside the JSM-7500FA showing stage, EDS detector (on top left), and column.
JEOL JSM-7500FA - Carbon nanotubes

Multi-walled carbon nanotubes and some catalyst Fe particles.
Sample provided by M.Sc. Antti Kaskela. Operator M.Sc. Juuso Korhonen.

 JEOL JSM-7500FA - Nanocellulose (uncoated)

Nanocellulose fibrils imaged without coating.
Sample and imaging by M.Sc. Juuso Korhonen.
JEOL JSM-7500FA - Au on C, 2 kV (GB) 500 kx

Au nanoparticles on carbon, 2 kV Gentle Beam mode, magnification 500 000. Image taken by JEOL at NMC.

 JEOL JSM-7500FA - Au on C, 1kV (GB) 500kx

Au nanoparticles on carbon, 1 kV Gentle Beam mode, magnification 500 000. Image taken by JEOL at NMC.
JEOL JSM-7500FA - Au on C, 500 V 500kx

Au nanoparticles on carbon, 500 V, magnification 500 000. Image taken by JEOL at NMC.

 JEOL JSM 7500FA - Au of C, 100 V 500kx

Au nanoparticles on carbon, 100 V, magnification 500 000. Image taken by JEOL at NMC.

Quick reference: SEMs

JEOL JSM-7500FA

  • Highest resolution
  • Analytical (EDX)
  • Only high vacuum
  • Small sample size

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  • High vacuum and variable pressure modes
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