• Transmission Electron Microscopes
• Scanning Electron Microscopes
• Atomic Force Microscopes
• Scanning Tunneling Microscopes
  • RHK UHV-750
  • Createc LT-STM low-temperature STM / AFM (to be installed in March 2012)
• X-Ray Scattering
• Tomography
• Sample Preparation

RHK UHV-750 variable temperature STM / nc-AFM

The ultra high vacuum operated RHK variable temperature 750 STM/AFM features flexible operating modes combined with low noise, high bandwidth control electronics. The system combines the stability of the “Beetle”-design with an internal spring suspension and eddy current dampening. It includes standard commercial STM tip wire mounts and standard AFM cantilever mounts with in vacuum storage and in-situ exchange without breaking vacuum. The open exchange holders also provide for in-situ thermal; e-beam and ion beam tip conditioning. The microscope can be operated at temperatures between 25 K and 1000 K.

STM:

• Low Current Imaging - < 1pA at 5kHz bandwidth
• High Speed Scanning - 3 Frames/second
• Superior thermal and mechanical stability
• Multiple tunneling spectroscopy options

AFM:

• Straightforward laser path without mirrors
• Intuitive orthogonal laser and PSD alignment
• Multiple operating modes (Normal Force, Lateral Force, Non-Contact etc.)

This device is being operated by the Surface Science and Atomic Scale Physics research groups inside the Department of Applied Physics.

Contact Doc Jani Sainio