JEOL JEM-2200FS
The JEM-2200FS combines a 200 kV field emission gun (FEG) and in in-column energy filter (Omega Filter) to produce a high-end, optimally configured TEM for energy filtered imagery.
| Manufacturer | JEOL |
|---|---|
| Model | JEM-2200FS |
| Emitter | Schottky FEG |
| Installation | 2008 |
| Resolution | - |
| Acceleration voltage | 80 kV 200 kV |
| Spot size | 0.2 nm |
| Objective lens | Cs ? nm Cc ? nm |
| Analytical | EDX EELS |
| Energy filter | Omega type |
| Cryo | No |
| Contact | Prof. Esko Kauppinen (requests for collaboration and usage) Prof. Janne Ruokolainen (requests for collaboration and usage) |
| Technical staff | Dr. Hua Jiang (operator) M.Sc. Zhen Zhu (operator) |
| Pricing | Upon request from Prof. Janne Ruokolainen |
| Availability | The instrument is available for outside users, such as other departments, universities, VTT, and industry. It is also possible to buy imaging service. Contact Prof. Janne Ruokolainen for details. |
Photos and micrographs
|
JEOL JEM-2200FS installed in NMC. |
Additional photograph of a detail. |
 TEM bright-field image of a Au particle imaged at 200 kV. |
 STEM bright-field image of a Au particle imaged at 200 kV. |
 STEM dark-field image of a Au particle imaged at 200 kV. |
 A Cs corrected micrograph of a Si (110) dumb-bell structure with 1.36 Å spacing between atom columns. |
 A single-walled carbon nanotube imaged at 200 kV TEM. |
 An energy-filtered TEM image of a single-walled carbon nanotube. |