X-Ray Scattering

Bruker Microstar Small-angle X-ray scattering (SAXS)

  • Bruker Microstar micro-focus rotating anode generator (Cu Kα 1.54 Å)
  • Bruker collimating multilayer mirror (Montel optics, double Göbel mirrors, 60 mm)
  • Bruker Hi-Star 2D detector 1024*1024 pixels
  • Collimation with JJ X-ray four blade vacuum slits
  • Sample to detector distance: 59 cm - 500 cm
  • Corresponding crystal lattice size 1.5 nm to 300 ... 500 nm
  • Fully automatic sample robotics (60 samples)
  • Sample environment: vacuum, helium, nitrogen, air
  • Heating possibility for 20 samples simultaneously 25 - 250 °C
  • Option for large in situ devices (rheology etc.)
  • SPEC software

Contact: M. Sc. antti.korpi [at] aalto [dot] fi?subject=SAXS (Antti Korpi)

 

Bruker Microstar Wide-angle X-ray scattering (WAXS)

  • Bruker Microstar micro-focus rotating anode genetor (Cu Kα 1.54 Å)
  • Incoatec focusing multilayer mirror (Montel optics, double Göbel mirrors, 100 mm)
  • Bruker Våntec 2D detector 2048*2048 pixels
  • Collimation with JJ X-ray four blade vacuum slits
  • Sample to detector distance 5 - 35 cm
  • Fully automatic sample robotics (60 samples)
  • Sample environment: vacuum, helium, nitrogen, air
  • Heating possibility for 20 samples simultaneously 25 - 250 °C

Contact: Prof. Janne Ruokolainen

 

Rigaku SmartLab X-ray diffractometer (XRD)

  • Rotating anode x-ray source (9 kW, Cu Kα,β)
  • Optics can be changed easily between Bragg-Brentano, parallel beam and Ge (220) × 2 double-bounce monochromator (with or without soller slits), collimator setup, and a focussing optics
  • 2D single photon counting pixel detector HyPix-3000 (77.5 × 38.5 mm, pixel size 100 μm × 100 μm)
  • Automatic optics and sample alignment
  • Eulerian cradle geometry where the sample can be kept horizontal while source and detector move
  • Several different sample stages (rotation (Rx,Ry), translation (x,y), standard)
  • Techniques covered by the instrument:
    • powder diffraction
    • x-ray reflectivity (XRR), thin film XRD
    • pole figure analysis
    • reciprocal space mapping
    • grazing-incidence XRD/SAXS at medium angles
    • single fibre measurements in transmission (with focussing CBO-f optics), orientation analysis
    • SAXS at medium angles in transmission
    • in-plane XRD measurements
    • residual stress analysis
    • XRD on liquid surfaces
  • Linkam heating/cooling stage HFSX-350-GI and a modified HFS600 for in situ XRD and grazing incidence XRD measurements (-196 °C to 600 °C) in air and nitrogen atmospheres

Contact ulla.vainio [at] aalto [dot] fi?subject=Rigaku%20XRD (Ulla Vainio), PhD (most techniques) or M. Sc. sampo.inkinen [at] aalto [dot] fi (Sampo Inkinen) (reciprocal space mapping)

 

All the x-ray scattering instruments are located in room 118 in Nanotalo, Puumiehenkuja 2, Espoo.

Page content by: | Last updated: 22.02.2017.