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Nanomicroscopy Center
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Transmission Electron Microscopes
JEOL JEM-2200FS
JEOL JEM-3200FSC
FEI Tecnai 12
Scanning Electron Microscopes
JEOL JSM-7500FA
Zeiss Sigma VP
Zeiss EVO HD15
Atomic Force Microscopes
Veeco Dimension 5000
Scanning Tunneling Microscopes
RHK UHV-750
X-Ray Scattering
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Sample Preparation
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2nd workshop in NorTEMnet on advanced TEM
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